68th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference

68th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference

2019.8.9 成果報告

題目

68th Annual Conference on Applications of X-ray Analysis Denver X-ray Conference

実施日・会期

2019年8月5日(月)~9日(金)

実施場所・会場

Westin Lombard Yorktown Center, Lombard, Illinois, U.S.A.

共用機器利用
  • 共焦点微小部蛍光X線分析装置(真空仕様)備考4.
  • 共焦点微小部蛍光X線分析装置(大型試料対応)備考4.
  • 卓上型全反射蛍光X線分析装置(リガク:ナノハンター)備考3.
備考
  1. K. Tsuji, Workshop Instructor on “Micro and Energy Dispersive XRF”
  2. K. Tsuji, Workshop Instructor on “Trace Analysis”
  3. T. Matsuyama, H. Yoshii, K. Tsuji,  TXRF Analysis using Carbon Coated Glass Substrate in Comparison with Conventional Sample Preparation(oral)
  4. T. Matsuyama,  S. Sonoda,  H. Nakano, K. Tsuji, Confocal Line XRF Analysis in Comparison with Confocal Point Micro XRF Analysis(poster)

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